NO. |
Publication |
3 |
Shin, H., Woo, J., Hong, S., Jeon, J.U., Pak, Y., and No, K.,: Formation of Ferroelectric Nano-Domains using Scanning Force Microscopy for the Future Application of Memory Devices, Integrated Ferroelectrics, 31, 163-171, (2000) |
2 |
Hong, S., Woo, J., Shin, H., Kim, E., Kim, K.-H., Jeon, J.U., Pak, Y., and No, K.,: Effect of Metal-insulator-semiconductor Structure Derived Space Charge Field on the Tip Vibration Signal in Electrostatic Force Microscopy, J. Vaccum Sci. Tech. B.,18 [6], 2688-2691, (2000) |
1 |
Shin, H., Lee, J.-H., Lee, K. Moon, W.K., Jeon, J.U, Lim, G., Pak, Y., Park, J.H. and Yoon, K.H.: An Application of Polarized Domains in Ferroelectric Thin Films using Scanning Probe Microscope, IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control, 47 [4], 801-807(2000) |