| NO. |
Publication |
| 6 |
Shin, H., Shin, J., Hong, S., Jeon, J.U., Song, H.W., Hong, J., and No, K., : Piezoelectric Hysteresis Measurement using Atomic Force Microscopy, Integrated Ferroelectrics,38, 31-38, (2001) |
| 5 |
No, K., Song, H.W., Hong, J., Woo, J., Shin, H., and Hong, S., :Stability and Read/Write Characteristics of Nano Ferroelectric Domains, Ferroelectrics,259, 289-298, (2001) |
| 4 |
Shin, H., Im, H., Jeon, J.U., Kim, E.S., and Pak, Y.E.,: Formation of in situ Patterned Iron Oxide Films using Micro Contact Printing and Selective Deposition, Molecular Crystal and Liquid Crystal,371, 473-76 (2001) |
| 3 |
Woo, J., Hong, S., Setter, N., Shin, H., Jeon, J.-U., Pak, Y.E., and No, K.: Quantitative analysis of the bit size dependence on the pulse width and pulse voltage in atomic force microscope based memory device, J. Vaccum Sci. Tech. B. May/June, 19, 818 824, (2001) |
| 2 |
Shin, H., Im, H., Jeon, J.U., Kim, E.S., and Pak, Y.E.,: Formation and Characterization of Crystalline Iron Oxide Films on Self-assembled Organic Monolayers and their in situ Patterning, J. Material Research, 16 [2], 564-69, (2001) |
| 1 |
Hong, S., Woo, J., Shin, H., Jeon, J.-U., Pak, E.Y, Colla, E.L., Setter, N., Kim, E., and No, K.: Principle of Ferroelectric Domain Imaging using Atomic Force Microscope, J. Appl. Phys.,89 [2], 1377-1386,(2001) |
